JPS6221008Y2 - - Google Patents
Info
- Publication number
- JPS6221008Y2 JPS6221008Y2 JP10613982U JP10613982U JPS6221008Y2 JP S6221008 Y2 JPS6221008 Y2 JP S6221008Y2 JP 10613982 U JP10613982 U JP 10613982U JP 10613982 U JP10613982 U JP 10613982U JP S6221008 Y2 JPS6221008 Y2 JP S6221008Y2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probe card
- opening
- probes
- synthetic resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 71
- 229920003002 synthetic resin Polymers 0.000 claims description 10
- 239000000057 synthetic resin Substances 0.000 claims description 10
- 229910052751 metal Inorganic materials 0.000 claims description 9
- 239000002184 metal Substances 0.000 claims description 9
- 238000005476 soldering Methods 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 description 6
- 235000012431 wafers Nutrition 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10613982U JPS5911443U (ja) | 1982-07-12 | 1982-07-12 | プロ−ブカ−ド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10613982U JPS5911443U (ja) | 1982-07-12 | 1982-07-12 | プロ−ブカ−ド |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5911443U JPS5911443U (ja) | 1984-01-24 |
| JPS6221008Y2 true JPS6221008Y2 (en]) | 1987-05-28 |
Family
ID=30248502
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10613982U Granted JPS5911443U (ja) | 1982-07-12 | 1982-07-12 | プロ−ブカ−ド |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5911443U (en]) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0636581Y2 (ja) * | 1987-01-07 | 1994-09-21 | 沖電気工業株式会社 | プロ−ブボ−ド |
-
1982
- 1982-07-12 JP JP10613982U patent/JPS5911443U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5911443U (ja) | 1984-01-24 |
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